Embedded Training for new generation parameter analysis

Added: (Thu Aug 26 2010)

Pressbox (Press Release) - The New Generation of Parameter Analyzers. Semiconductor parameter analyzers have evolved to solve many of these test problems. Now its possible to find test systems that combine DC I-V, C-V, and ultra-fast pulse I-V test capabilities.
Naturally, the computerized operating system and test library of an integrated test system of this type must make it easy handle a broad range of test protocols, and quickly switch between the three different types of test. An example of this is the Keithley Test Environment Interactive (KTEI) operating software, which provides a single test environment that allows a user to combine
DC current measurements required. The test libraries include predefined tests for making most of the common charge pumping measurements, such as a pulsed base voltage sweep or a pulsed voltage amplitude sweep. In the case of solar cell testing, integrated I-V and C-V measurement capabilities make it possible to perform a wide range of measurements, including capacitance-frequency (C-f), drive level capacitance profiling (DLCP), four-probe resistivity (, ), and Hall voltage (VH). In addition, the software automates the measurements and provides results analysis.
Pushing the Limits of Instrumentation. While its important for a test system to handle the day-to-day measurements of modern devices and materials, the development of leading edge technology often demands more. This makes parameter analyzers with open system architectures even more important. To address the needs of advanced technologies,
Keithleys Model 4200-SCS allows users to modify any of the measurements in its test libraries, such as C-V, C-t, and C-f measurements. This opens the door for more customized testing and analysis, such as that needed for solar cells; high- and low-k structures; MOSFETs; BJTs; diodes; III-V compound devices; carbon nanotube (CNT) devices; doping profiles, TOX, and carrier lifetime tests; as well as junction, pin-to-pin, and interconnect capacitance measurements.measurements made with different instrument types into a single test sequence.
By using plug-in modules for the hardware chassis in a parameter analyzer, the test system can be readily optimized to address specific applications or sets of applications. Just as important, as new applications come along, a modular architecture allows for cost-effective system upgrades. For instance, in the Model 4200-SCS system, builders can choose from medium- and high-power Source-Measure Units for DC I-V measurements, an optional capacitance meter for C-V measurements, and an ultra-fast (pulsed) I-V module for high-speed pulse measurements.
Thus, the latest generation of parameter analyzers offers users a complete solution for an application like charge pumping, because the test system can be configured for the ultra-fast pulse generation and sensitive